Library Catalog | Simmons University

1

Failure analysis a practical guide for manufacturers of electronic components and systems / Marius I. Bâzu, Titu-Marius I. Bâjenescu.

by Bâzu, M. I. 1948-
Published 2011

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2

ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA / organized by ISTFA/2015, Electronic Device Failure Analysis Society (EDFAS), ASM International.

Published 2015

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3

ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California / sponsored by EDFAS.

Published 2003

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4

ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas,... organized by Electronic Device Failure Analysis Society, ASM International.

Published 2014

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5

ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. / sponsored by EDFAS, ISTFA.

Published 2002

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6

ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California / sponsored by EDFAS.

Published 2001

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7

Microelectronic failure analysis desk reference : 2001 supplement / prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee.

Published 2001

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8

ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International.

Published 2005

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9

ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.

Published 1996

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10

ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International.

Published 2007

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11

Microelectronic failure analysis desk reference. 2002 supplement / prepared under the direction of the Electronic Device Failure Analysis Society publications committee.

Published 2002

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12

ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, US... sponsored by Electronic Device Failure Analysis Society.

Published 2013

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13

ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2010, ASM International.

Published 2010

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14

ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2004, ASTM International.

Published 2004

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15

Microelectronics failure analysis desk reference / edited by Richard J. Ross.

Published 2011

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16

ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas / sponsored by ISFTA, ASM International.

Published 1998

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17

ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California / sponsored by ASM International.

Published 1997

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18

ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.

Published 2006

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19

ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, Califo... sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International.

Published 2009

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20

ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.

Published 1999

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21

Boundary-scan interconnect diagnosis José T. de Sousa, Peter Y.K. Cheung.

by Sousa, José T. de.
Published 2001

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22

Design for at-speed test, diagnosis, and measurement edited by Benoit Nadeau-Dostie.

Published 2000

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23

ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.

Published 2012

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24

ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International.

Published 2008

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25

A designer's guide to built-in self-test Charles E. Stroud.

by Stroud, Charles E.
Published 2002

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26

ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA... sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International.

Published 2011

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27

ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

Published 2000

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28

Parts selection and management edited by Michael G. Pecht.

Published 2004

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