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International Symposium for Testing and Failure Analysis San Jose, Calif.)
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ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International.
Published 2005
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ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International.
Published 2007
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ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, Califo... sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International.
Published 2009
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ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA... sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International.
Published 2011
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