Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / edited by Prasad Yarlagadda and Yun-Hae Kim.

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Bibliographic Details
Alternate Title:ICMIA 2014
Online Access: Access E-Book
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Corporate Author: International Conference on Measurement, Instrumentation and Automation Shanghai, China)
Other Authors: Yarlagadda, Prasad (Editor), Kim, Yun-Hae (Editor)
Format: Conference Proceeding eBook
Language:English
Published: Zurich, Switzerland : TTP, 2014.
Series:Applied mechanics and materials ; Volume 568-570.
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Call Number: TA165 .I584 2014